RJ Lee Group Senior Staff Presents at M&M 2007


Two members of RJ Lee Group’s senior staff attended the Microscopy and Microanalysis 2007 Conference, the annual meeting of the Microbeam Analysis Society (MAS) and Microscopy Society of America (MSA). It was held August 5-9 in Ft. Lauderdale, Florida.

The Microscopy and Microanalysis 2007 Conference, the annual meeting of the Microbeam Analysis Society (MAS) and Microscopy Society of America (MSA), was held August 5-9 in Ft. Lauderdale, Florida. The scientific program encompassed microscopy related topics in the fields of Biological Sciences, Physical Sciences and Technology and Instrumentation. The program included symposia on nanotechnology, pharmaceuticals, biomaterials, nano-electronics, quantitative X-ray microanalysis, spectral imaging, focused ion beam applications, electron energy loss spectroscopy, atom probe tomography, and digital imaging. Kristin Bunker attended the meeting as a Director of MAS and presented a poster titled ‘The Database Solution to Particle-by-Particle Analysis of Mixed Mineral Dusts’. Dave Exline was invited to give a platform presentation in the pharmaceutical symposia titled ‘Forensic Applications in Pharmaceutical Testing’.

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