RJ Lee Group has added several pieces of instrumentation to its collection of high-end analytical equipment, including the Hitachi HD-2300 field emission scanning transmission electron microscope (FE-STEM). The HD-2300 200kV FE-STEM is the newest high resolution, high throughput STEM/SEM designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance with the ease of use of a basic SEM. The other microscopes include the HF-2000 cold field emission transmission electron microscope (FE-TEM); TM-1000 Tabletop Microscope; and S-3400N variable pressure scanning electron microscope (VP SEM).
Here is a brief description of each instrument:
HD-2300 Scanning Transmitted Electron Microscope
Hitachi’s HD-2300 200kV FE-STEM is the newest high resolution, high throughput STEM/SEM designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance with the ease of use of a basic SEM. With an energy dispersive X-ray spectroscopy (EDS) solid angle of 0.4sr, high sensitivity EDS spectral maps can be generated quickly. Hitachi’s live diffraction observation allows simultaneous viewing of the image and diffraction pattern, enabling adjustment of a specific sample orientation without tedious switching between diffraction and imaging allow for rapid image observation with the correct sample orientation. The HD-2300 is an essential instrument for the advancement of Nanotechnology in the 21st Century.
HF-2000 Cold Field Emission Transmission Electron Microscope
The Hitachi HF-2000 is a high performance FE-TEM/STEM designed for routine materials characterization at high throughputs. The cold field emitter provides high resolution imaging and analysis due to the high source brightness (109 A/cm2 sr) and small energy spread of 0.3eV. The excellent coherency of the emitter allow for the ultimate performance for holography and EELS. Nano-area diffraction or CBED is another excellent feature of the HF-2000 for the characterization of nano-particles or interfacial variations in materials. The cold field emission source also provides approximately a nano ampere of probe current in a finely focused probe of less than 1nm. The HF-2000 has excellent analytical capabilities at the nanometer level for high end characterization of tomorrow’s nanomaterials.
TM-1000 Tabletop MicroscopeLaboratory Manager – QA Manager
Compact, lightweight, easy to use, and operates from any 120V outlet makes the TM-1000 Tabletop Microscope a versatile microscope with resolution 10 fold higher than an optical microscope. All that is required to produce stunning, high quality images is to load the sample, push auto start, auto contrast and brightness and auto focus. No sample preparation is necessary and with less than 10 minutes of training you can begin to take images like a pro. Unlike most other Tabletop Microscopes, the TM-1000 can be equipped with an optional EDS system.
S-3400N Variable Pressure Scanning Electron MicroscopeLaboratory Manager – QA Manager
The S-3400N VP SEM continues to be the market leader for large chamber, tungsten based variable pressure SEMs. Several patents such as Quad Bias, SE Bias Electron Accelerator Plate, high speed five quadrant Backscattered Electron Detector, 3D Viewer function for surface roughness and 3D rendering, plus a wealth of other features provide the best performance and ease of use over any other manufacturer. The analytical chamber design of the S-3400N allows simultaneous analysis of several detector types such as EDS, wavelength-dispersive spectrometer (WDS), and electron backscattered diffraction (EBSD). Samples as tall as 100mm and as wide as 250mm can be observed with the computer controlled, eucentric motorized stage.