Pittcon


Abstracts

“Characterization of Nanomaterials Using Advanced FESEM/STEM and XPS Techniques,” Brian R. Strohmeier, Kristin L. Bunker, Jacqueline L. Sturgeon, John D. Piasecki, James P. Marquis, Jr., Traci L. Lersch, and Keith Wagner, Oral presentation on February 28, 2010, 3:15-3:35 PM, Room 206B.

“XPS and FESEM/STEM Surface Characterization of Activated Carbon, Carbon Black, and Carbon Nanotubes,” Brian R. Strohmeier, John D. Piasecki, Kristin L. Bunker, and Jacqueline L. Sturgeon, Poster presentation on March 3, 2010, 1:00-3:00 PM, Exposition Floor Poster Area.

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