Pittcon 2011 Conference and Expo

Georgia World Congress Center, Atlanta, GA – March 13-18, 2011

RJ Lee Group to Host Technical Session and Present Papers

“New Advances in Microscopic Imaging Techniques”, Monday, March 14, 2011

RJ Lee Group will host a special technical session that will cover some of the latest advances in high-resolution electron microscopy instrumentation, techniques, and applications. Eight well-known experts will make presentations that include a variety of instrumental techniques including scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and helium ion microscopy (HIM).

Exploring the Nano World with SEM/STEM
M. Sparrow, T. Lersch, J. Sturgeon, G. Casuccio, Z. Liu, and J. Yang,
SPEAKER: Mark Sparrow
DATE: Monday, March 14, 2011
TIME: 10:15-10:35 AM
LOCATION: Room 315, Georgia World Conference Center

“XPS Surface Characterization of Gunshot Residue (GSR): A Complement to Forensic SEM/EDS Analysis
A. J. Schwoeble, M. Sparrow, and J. D. Piasecki
PRESENTER: Mark Sparrow
DATE: Wednesday, March 16, 2011
TIME: 4:15-4:35 PM
LOCATION: Room 403, Georgia World Conference Center

“Surface Characterization of Disposable Laboratory Gloves by X-Ray Photoelectron Spectroscopy (XPS)”
M. Sparrow and J. D. Piasecki
PRESENTER: Mark Sparrow
DATE: Thursday, March 17, 2011
TIME: 8:20-8:40 AM
LOCATION: Room 406, Georgia World Conference Center

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