Dr. Kristin Bunker, Senior Scientist at RJ Lee Group, Inc., will be making a platform presentation entitled “Portable XRF and Raman Analysis of a ‘Modigliani’ Signature Painting” at the Microscopy and Microanalysis 2012 meeting in Phoenix, Arizona. The presentation will take place on Tuesday, July 31, at 2 PM at Symposium: A13.03 – Micro X-Ray Fluorescence-03. Dr. Bunker’s presentation will focus on RJ Lee Group’s analysis as part of an effort to authenticate a piece of art that was purportedly painted by renowned Italian artist Amedeo Modigliani.
The M&M conference is the premier meeting, spanning the physical, life and analytical sciences, which brings together delegates from around the globe to report on the latest work and advances in microscopy and microanalysis. The conference is being held at the Phoenix Convention Center in downtown Phoenix, AZ.