Those of us working in materials, devices, and life sciences are always looking for new techniques to improve disease diagnosis and treatment. That means paying close attention to cutting-edge technology and trying to better understand its role in the life sciences. One area that has shown growth, especially over the last 10 years, is nanotechnology. New products seem to be emerging with “nano” features on a regular basis. The challenge of adopting nano, however, is that it’s still being explored from both a scientific and regulatory standpoint. This constantly evolving landscape requires scientists and engineers to use due diligence across the product lifecycle when attempting to incorporate nanotechnology into any type of device.
Evolving at a similarly brisk pace is the use of point-of-care diagnostics (POC) in the health care industry. POC provides rapid, on-site results and allows for more informed medical decisions. The development of rapid, miniaturized, and sensitive POC devices lends itself to advanced materials and fabrication methods, including the use of novel nanomaterials. Carbon nanotubes, for example, possess remarkable electrical properties that make them attractive for use in electrical-based biosensing techniques for POC devices.
On November 7, 2013, at the Institute of Electrical and Electronics Engineers (IEEE) conference in North Carolina, I will be presenting “Vision Across Product Lifecycle: Nanotechnology Integration in Point-of-Care Diagnostics.” During the talk, I will apply important lifecycle considerations to a case study that explains how CNTs can act as transducers in biosensors to carry electrical signals. The case study will illustrate how to:
- Identify and address nanotechnology safety issues
- Manage quality control concerns
- Conduct proper sample preparation
- Select proper types of analyses
- Characterize nanomaterials for use across the product lifecycle
If you are looking to integrate nanotechnology with next generation POC devices and want to take your research from lab to application, you will find this approach and illustrated case study very helpful.
Please join me at IEEE on November 7,2013. I look forward to seeing you there!
A special “thank you” to my colleagues Julianne Wolfe, Kristin Bunker, and Elizabeth Wolff for their contributions to the presentation.