RJ Lee Group Presents Validation of Automated SEM Technique for Cement Characterization at ICMA

“Validation of an Automated Scanning Electron Microscopy (SEM) Technique for the Characterization of Cements,” a collaborative effort, will be presented at the upcoming International Cement Microscopy Association (ICMA) Conference on Cement Microscopy. The paper is the work of combined resources of the University of Florida (UFL), Florida Department of Transportation (FDOT) and RJ Lee Group’s laboratory. Authors include Benjamin Watts and Christopher Ferraro of the UFL Gainesville, Engineering School of Sustainable Infrastructure & the Environment, H.D. Deford of FDOT Gainesville and April Snyder and C.M. Hefferan of RJ Lee Group, Monroeville, Pa. Ms. Snyder, RJ Lee Group Materials Construction Laboratory Manager, will deliver the presentation on Monday, May 4, 2015 at 9:40 – 10:20am. The conference is being held at the Crowne Plaza Hotel, downtown Seattle, Wa. Published proceedings of the papers presented are available at the meetings and serve as a source of references for problem solving in the areas of clinker, cement, concrete, and other building materials