October 8, 2008
RJLG Improves Capabilities in X-ray Photolelectron Spectroscopy with Purchase of K-Alpha System
RJ Lee Group (RJLG), a Pittsburgh-based scientific analysis,
consulting, and development firm, announces the upcoming launch of
Thermo Fisher Scientific's K-Alpha X-ray photoelectron spectroscopy
(XPS) system in their analytical work. XPS is a surface
spectroscopic technique that measures elemental composition within
the topmost 2-10 nanometers of a material surface. XPS can
also provide important oxidation state and other chemical bonding
information for many elements that is not available from other
techniques. Dr. Brian Strohmeier, senior scientist and manager
of corporate TEM and optical laboratory operations, gave a clear
perspective on the value of the K-Alpha when he said, "The K-Alpha
XPS system represents the latest state-of-the-art in photoelectron
spectroscopy in terms of total instrument performance and
capability range. The instrument was designed to increase
both the sample throughput of the surface analysis laboratory and
the reliability of the data produced. This helps us solve our
client's most difficult surface-related problems in the most
efficient manner."
In general, the XPS method is a valuable source of information for
many different applications, and RJLG scientists rely upon this
method to secure highly pragmatic data in numerous areas,
including: adhesion failures, corrosion studies, paint defects,
coating characterizations, defect and failure analysis, surface and
depth profiling, biocompatibility studies, surface contamination
identification, surface oxidation studies, and polymer surface
characterization.
RJLG applies the XPS technique to our samples for several reasons,
including its ability to provide both qualitative and
semi-quantitative results for most elemental analysis, the variety
of samples the instrument will accept, the ease of sample
preparation, and the nondestructive nature of testing compared to
other electron and ion beam surface analysis techniques. This
method produces excellent results while reducing the time and costs
involved with sampling procedures - allowing RJLG to pass on
valuable savings to our clients.
More specifically, the K-Alpha system brings the importance of XPS
up a notch with significant technical enhancements. The
compact, fully integrated, and highly automated design of the
K-Alpha simplifies operation and improves all aspects of sample
analysis and data processing, which results in reduced cost of
analysis. The instrument utilizes a monochromatic aluminum K-Alpha
X-ray source with variable microfocusing capability (30-400 μm), a
high sensitivity electron energy analyzer, and a multi-channel
detection system to provide maximum sensitivity for all types of
analysis. The K-Alpha is the ideal XPS instrument for all
types of solid sample surface analysis such as metals, ceramics,
polymers, biological materials, semiconductors, glasses, thin
films, and other vacuum-compatible inorganic and organic
materials.
RJLG, first established in 1980 with a core group of five
individuals, now has operations in five states and employs
approximately 250 people who are committed to the heart of RJLG -
innovation and excellence. Technical consulting and materials
characterization forms the baseline of our work, but we also excel
in education advancement, software development, technology
commercialization, and resource recovery. As a result of our
diverse interests and our expertise in materials science, RJLG is
well positioned to identify and pursue new business opportunities
as we continue to develop unique approaches to our nation's biggest
scientific and environmental hurdles. To find out more about
our best-in class analytical and consulting services, check out the
RJLG Web site at http://www.rjlg.com/.
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