October 1, 2009
State-of-the-Art Instrumentation from Hitachi
RJ Lee Group has added several pieces of instrumentation to its
collection of high-end analytical equipment, including the Hitachi
HD-2300 field emission scanning transmission electron microscope
(FE-STEM). The HD-2300 200kV FE-STEM is the newest high resolution,
high throughput STEM/SEM designed for quick, comprehensive sample
evaluation, with unmatched analytical capabilities and consistent
high-end performance with the ease of use of a basic SEM. The other
microscopes include the HF-2000 cold field emission
transmission electron microscope (FE-TEM); TM-1000 Tabletop
Microscope; and S-3400N variable pressure scanning electron
microscope (VP SEM).
Here is a brief description of each instrument:
HD-2300 Scanning Transmitted Electron Microscope
Hitachi's HD-2300 200kV FE-STEM is the newest high resolution,
high throughput STEM/SEM designed for quick, comprehensive sample
evaluation, with unmatched analytical capabilities and consistent
high-end performance with the ease of use of a basic SEM.
With an energy dispersive X-ray spectroscopy (EDS) solid angle of
0.4sr, high sensitivity EDS spectral maps can be generated
quickly. Hitachi's live diffraction observation allows
simultaneous viewing of the image and diffraction pattern, enabling
adjustment of a specific sample orientation without tedious
switching between diffraction and imaging allow for rapid image
observation with the correct sample orientation. The HD-2300 is an
essential instrument for the advancement of Nanotechnology in the
21st Century.
HF-2000 Cold Field Emission Transmission Electron Microscope
The Hitachi HF-2000 is a high performance FE-TEM/STEM designed for
routine materials characterization at high throughputs. The
cold field emitter provides high resolution imaging and analysis
due to the high source brightness (109 A/cm2 sr) and small energy
spread of 0.3eV. The excellent coherency of the emitter allow for
the ultimate performance for holography and EELS. Nano-area
diffraction or CBED is another excellent feature of the HF-2000 for
the characterization of nano-particles or interfacial variations in
materials. The cold field emission source also provides
approximately a nano ampere of probe current in a finely focused
probe of less than 1nm. The HF-2000 has excellent analytical
capabilities at the nanometer level for high end characterization
of tomorrow's nanomaterials.
TM-1000 Tabletop Microscope
Compact, lightweight, easy to use, and operates from any 120V
outlet makes the TM-1000 Tabletop Microscope a versatile microscope
with resolution 10 fold higher than an optical microscope.
All that is required to produce stunning, high quality images is to
load the sample, push auto start, auto contrast and brightness and
auto focus. No sample preparation is necessary and with less
than 10 minutes of training you can begin to take images like a
pro. Unlike most other Tabletop Microscopes, the TM-1000 can
be equipped with an optional EDS system.
S-3400N Variable Pressure Scanning Electron Microscope
The S-3400N VP SEM continues to be the market leader for large
chamber, tungsten based variable pressure SEMs. Several
patents such as Quad Bias, SE Bias Electron Accelerator Plate, high
speed five quadrant Backscattered Electron Detector, 3D Viewer
function for surface roughness and 3D rendering, plus a wealth of
other features provide the best performance and ease of use over
any other manufacturer. The analytical chamber design of the
S-3400N allows simultaneous analysis of several detector types such
as EDS, wavelength-dispersive spectrometer (WDS), and electron
backscattered diffraction (EBSD). Samples as tall as 100mm
and as wide as 250mm can be observed with the computer controlled,
eucentric motorized stage.
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