Publications

Annealing Study of Grain Boundary Engineered Copper Using High Energy X-Ray Diffraction Microscopy

Publication Information:

Li, S.F., R.M. Suter, C.M. Hefferan, J. Lind, U.Lienert, J. Bernier, M. Kumar, and B. Reed. “Annealing Study of Grain Boundary Engineered Copper Using High Energy X-Ray Diffraction Microscopy,” Presented at TMS 2012, Orlando, FL, March 2012.

Year: 2012

Topics: Materials Characterization, Metals & Alloys