Characterization of Nanomaterials Using Advanced FESEM/STEM and XPS Techniques

Publication Information:

Strohmeier, B.R., K.L. Bunker, J.L. Sturgeon, J.D. Piasecki, J.P. Marquis, Jr., T. L. Lersch and K. W. Wagner, Characterization of Nanomaterials Using Advanced FESEM/STEM and XPS Techniques, presented at Pittcon, 2010, Orlando, FL.

Year: 2010