Publications

Grain Growth of High Purity Nickel with High Energy X-Ray Diffraction Microscopy

Publication Information:

Hefferan, C.M., S.F. Li, J.Lind, U.Lienert, A.D. Rollett, and R.M. Suter “Grain Growth of High Purity Nickel with High Energy X-Ray Diffraction Microscopy,” Presented at TMS 2012, Orlando, FL, March 2012.

Year: 2012

Topics: Materials Characterization, Metals & Alloys