Publications

Measurement of Annealing Phenomena in High Purity Metals with Near-field High Energy X-ray Diffraction Microscopy

Publication Information:

Hefferan, C.M. “Measurement of Annealing Phenomena in High Purity Metals with Near-field High Energy X-ray Diffraction Microscopy,” PhD Thesis, Carnegie Mellon University, (2012).

Year: 2012

Topics: Materials Characterization, Metals & Alloys