Publications

Microstructure Geometry and Topology Tracking Using High Energy X-Ray Diffraction Microscopy

Publication Information:

Li, S.F., B.W. Reed, J.V. Bernier, M.Kumar, J.Lind, C.M. Hefferan, R.M. Suter, and U. Lienert, “Microstructure Geometry and Topology Tracking Using High Energy X-Ray Diffraction Microscopy,” Presented at MRS 2012, Boston, MA, November 2012.

Year: 2012

Topics: Materials Characterization