Nanoparticle Characterization using Advanced SEM/STEM Instrumentation

Publication Information:

Bunker, K.L., T. Lersch, J.P. Marquis, B.R. Strohmeier and G.S. Casuccio, Nanoparticle Characterization using Advanced SEM/STEM Instrumentation, presented at MAS Topical Conference: Microanalysis of Particles 2009, College of Microscopy/ McCrone Associates, Westmont, IL, April 2009; and presented at American Vacuum Society 56th International Symposium & Exposition, 2009, San Jose, CA.

Year: 2009