Publications

RJ Lee Group’s Advanced FESEM/STEM and XPS Analytical Services for Exploring the Nano-World

Publication Information:

Strohmeier, B.R., K.L. Bunker, and J.D. Piasecki “RJ Lee Group’s Advanced FESEM/STEM and XPS Analytical Services for Exploring the Nano-World”, American Vacuum Society 56th International Symposium & Exposition, San Jose, CA, November 2009.

Year: 2009

Topics: Nano-characterization