TEM and FESEM: The Right Combination for Enhanced Particle Characterization
Bunker, K.L., D. McAllister, K.A. Allison, K.Wagner, K.P. Rickabaugh, A.M. Levine, B.R. Strohmeier, R.J. Lee, “TEM and FESEM: The Right Combination for Enhanced Particle Characterization”, presented at the Microscopy & Microanalysis 2008 Meeting, Albuquerque, NM, August 2008; and presented at the Hitachi/ORNL Workshop on Advanced Electron Microscopy in Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, November 2008.
Materials Characterization, Particle Characterization