Tracking Geometrical Features using Near-field High Energy X-ray Diffraction Microscopy

Publication Information:

Li, S.F., J. Lind, C.M. Hefferan, A.D. Rollett and R.M. Suter, Tracking Geometrical Features using Near-field High Energy X-ray Diffraction Microscopy, Presented at International Conference on 3D Materials Science 2012, 2012, Seven Springs, PA.

Year: 2012