Publications

Tracking Geometrical Features using Near-field High Energy X-ray Diffraction Microscopy

Publication Information:

Li, S.F., J. Lind, C.M. Hefferan, A.D. Rollett, and R.M. Suter, “Tracking Geometrical Features using Near-field High Energy X-ray Diffraction Microscopy,” Presented at International Conference on 3D Materials Science 2012, Seven Springs, PA, July 2012.

Year: 2012

Topics: Materials Characterization