Publications

X-ray Photoelectron Spectroscopy (XPS): The Original Nano-Analytical Technique for Materials Surface Characterization

Publication Information:

Strohmeier, B.R., J.D. Piasecki, K.L. Bunker, J.L. Sturgeon, R.G. White, and R.J. Lee, X-ray Photoelectron Spectroscopy (XPS): The Original Nano-Analytical Technique for Materials Surface Characterization, presented at the Electron Microscopy & Microanalysis Workshop: Problem Solving in the Nanotechnology World, June 2009.

Year: 2009

Topics: Nano-characterization