Strohmeier, B.R., K.L. Bunker, C.L. Lopano, J.P. Marquis, Jr., J.D. Piasecki, K.E. Bennethum, R.G. White, T.S. Nunney, and R.J. Lee, XPS and SEM/STEM Characterization of Silver Nanoparticles Formed from the X-ray-Induced and Thermal Reduction of Silver Behenate, presented at Microscopy and Microanalysis Annual Meeting, Richmond, VA, July 2009; and presented at the American Vacuum Society 56th International Symposium and Exposition, San Jose, CA, November 2009.