Product Stewardship Society 2018 Conference Replay: The GHS/SDS Life Cycle for Authoring Professionals – Where Hazard Classification Begins

Product Stewardship Society 2018 Conference Replay: The GHS/SDS Life Cycle for Authoring Professionals – Where Hazard Classification Begins

29th November 2018

Relive some of the excitement of Product Stewardship 2018!  Join Don Ewert and RJ Lee Group’s Product Stewardship Team for a replay of their 2018 conference presentation on November 29th, from 1:00 PM ET – 2:30 PM ET. The presentation will be free for members, and $59 for nonmembers. 

The presentation highlights GHS-Compliant Hazard Inversion services offered through our Product Stewardship Group and includes a review of the analytical tools utilized as well as the outcomes obtained from across a number of unique product lines and material ingredients.

Herein is an abstract summary:

“With adoption of GHS, OSHA has incorporated a highly complex characterization scheme into what was once a well-structured system of hazard communication. Given the ability to now employ “expert judgement” in the hazard classification process, OSHA’s “Letter of Interpretation” library is destined to swell as authors choose between ingredient profiles and the use a final mixture approach. While the first offers simplicity and processing speed, the latter requires rigor and a host of analytical techniques. Both methods have advantages, but only the final mixture approach provides “hazard inversion” on a scientifically validated basis. This session intermingles GHS background with real-world examples of the hazard classification life cycle. Attendees will not only gain insight into GHS flexibility, but will also acquire the tools needed to apply these practices.”

This rebroadcast is part of a series from the Product Stewardship Society, taking the popular sessions from the 2018 conference and providing another opportunity for more viewers. As one of the more popular and well-attended sessions, this presentation received positive feedback from attendees.

To attend, please click here.