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The Right Instrumentation and Techniques for Your Solution

Instrumentation and Techniques


Instrumentation and Techniques

Accurate analytical results depend on many levels of expertise including using the right instrument, the correct sample preparation, and the best-suited technique. When that combination also includes expert and clear interpretation, you have results that not only provide answers, but answers that you can understand. For more information, please call us at 1.800.860.1775, option 5.

Our materials experts are always ready to discuss the instrumentation and the techniques available and how they apply to your situation based on the results you are looking for. In addition to standard analytical chemistry and optical microscopy services found in our Laboratory Testing Guide, we use the following instrumentation and techniques when seeking resolution to our customers’ problems.

Scanning Electron Microscopy (SEM)

  • Variable pressure and large-size chambers
  • Tungsten and field emission SEM
  • Secondary electron and backscattered electron imaging
  • Light element EDS detection
  • X-ray element mapping
  • Electron Backscatter Diffraction (EBSD)

High Resolution Scanning Transmission Electron Microscopy (STEM)

  • 100x – 10,000,000x
  • 120kV or 200kV accelerating voltage
  • SE, DF, and BF imaging
  • Electron diffraction
  • Field emission source
  • EDS detector

Ultra-High Resolution Scanning Electron Microscopy (UHR-SEM)

  • 60x – 2,000,000x
  • 0.2kV to 30kV accelerating voltage
  • Secondary and backscattered electron imaging
  • Dark field and bright field STEM imaging
  • Cold field emission source
  • 30mm2
  • SDD EDS detector

Transmission Electron Microscopy (TEM)

  • 120kV or 200kV accelerating voltage
  • Electron diffraction
  • EDS detector

X-ray Photoelectron Spectroscopy (XPS)

  • Survey spectra (qualitative and quantitative information)
  • Depth profiling analysis
  • High resolution spectra (chemical state analysis)
  • Line scans
  • Area mapping

Fourier Transform Infrared Spectroscopy (FTIR)

  • Attenuated Total Reflectance (Ge crystal)
  • Grazing Angle
  • Reflectance

Dispersive Raman Spectroscopy

  • High spatial and spectral resolutions (800mm monochromator)
  • 3 laser sources: 437nm (blue), 633nm (red), 785nm (near IR)
  • Wide mapping capabilities from 2 microns to 100mm x 80mm
  • High precision, ultra-fast confocal imaging

Thermogravimetric Analysis / Differential Scanning Calorimetry

 

Inductively Coupled Plasma (ICP)

      • Atomic Emission Spectrometry (ICP-AES)
      • Mass Spectrometry (ICP-MS)

Gas Chromatography

      • Electron Capture Detection (GC-ECD)
      • Flame Ionization Detection (GC-FID)
      • Mass Spectrometry (GC-MS)

High Performance Liquid Chromatography (HPLC)

Ion Chromatography (IC)

Cold-Vapor Atomic Absorption (CVAA)

X-ray Diffraction (XRD)

X-ray Fluorescence (XRF)

Phase Contrast Microscope (PCM)

Polarized Light Microscope (PLM)

Proton-Transfer-Reaction Mass Spectrometry (PTR-MS)

      • Single-digit pptv-level sensitivity for most VOCs
      • Real-time absolute quantitative analysis
      • No sample preparation
      • Real-time data in response time of less than 100ms
      • RJ Lee Group is the only U.S. Distributor for Ionicon Analytik BmbH for the sales and service of PTR-MS trace gas analyzers.

 

Customizable Automated Techniques

In response to customer requirements, we have developed laboratory automation techniques that reduce the time needed to analyze large numbers of particles to provide results more quickly while still continuing to maintain data quality.

Computer-Controlled Scanning Electron Microscopy (CCSEM)

CCSEM is an automated analytical technique that combines a scanning electron microscope (SEM), x-ray analyzer (EDS) and software-controlled digital scan to quickly locate, size and characterize large numbers of individual particles and group them based on their elemental composition and shape. A primary use for this technique is in the automated analysis of gun shot residue (GSR) particles. This technique can be customized based on the application needed.

Automated Steel Cleanliness Analysis Tool (ASCAT)

This technique is based on CCSEM and is primarily used as a quality control tool for characterizing inclusions in steel that have been trapped during the solidification process. The automated analysis quickly identifies and characterizes the steel inclusions but can also be customized based on the application needed.