Contamination in Current Manufacturing Processes
Manufacturers create innovative materials with unique characteristics, using production technologies that incorporate new processes. These variables affect the quality of the finished product. More complex products potentially contain contaminants that warrant investigation, and possibly an integrated analytical program that extends beyond examining the original material of concern. Such a program requires sophisticated investigative tools and the expertise to identify and locate foreign particulate matter (FPM) throughout the product’s life cycle.
How RJ Lee Group Is Meeting the Challenge
RJ Lee Group’s instrumentation provides the analytical flexibility and precision needed to investigate and identify foreign particulate matter and defects. Our scientists provide the operational skill and analytical expertise required with a range of investigative techniques including:
- Contamination Identification
- Source Determination and Root Cause Analysis
- Particle Sizing and Counting
- Data basing of Process Materials for a Proactive FPM Program
- Raw Materials Testing and Product Sampling
- ID of Glass Delamination and Other Failures
- Metallurgy and Manufacturing-Associated Defects
- Investigative Chemistry
- Nondestructive Testing and Evaluation for Microelectronics
- Nanocharacterization Including Coatings and Pharmaceuticals
Automated Particle Analysis
Contaminants of varying chemistry and morphology may impact product quality in any sample, in any part of the manufacturing process. Computer-controlled scanning electron microscopy (CCSEM) allows for unattended measurement analysis when testing large sample quantities or large areas, such as in steel production. CCSEM quickly provides size, shape and chemistry/composition, and reports the results in a clear, easy-to-understand manner.
For more information, please call us at 1.800.860.1775, option 1.