Microscopy & Microanalysis 2009 Conference is the Annual Meeting of the Microscopy Society of America and the Microbeam Analysis Society and was this year Co-sponsored by the International Metallographic Society. It was held July 26-30 at the Richmond Convention Center in Richmond, VA.

RJLG's Dr. Kristin Bunker presented two posters at this event. Both posters will be presented on Monday, July 27 between 3:30PM-5:00PM.

• B.R. Strohmeier, K.L. Bunker, C.L. Lopano, J.P. Marquis, Jr., J.D. Piasecki, K.E. Bennethum, R.G. White, T.S. Nunney, and R.J. Lee, ‘XPS and SEM/STEM Characterization of Silver Nanoparticles Formed from the X-ray-Induced and Thermal Reduction of Silver Behenate', Microscopy and Microanalysis 2009 Annual Meeting: Microscopy and Microanalysis of Nanostructured Materials, Richmond, VA, July 26-30, 2009.

• J.J. McCarthy, F.E. Pfefferkorn, D. Bello, G. Haddad, and K.L. Bunker, ‘Electron Microscopy and EDS of Nanoparticles Generated During Friction Stir Welding', Microscopy and Microanalysis 2009 Annual Meeting: Microscopy and Microanalysis of Nanostructured Materials, Richmond, VA, July 26-30, 2009.

For More Information: http://mm2009.microscopy.org