RJ LeeGroup - Qualifications - Projects - Applying Automation to Wear Debris Particle Characterization (ASTM-F 1877) for Spinal Implants

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With expertise across multiple disciplines, RJLG has the resources to develop innovative methodologies for implementing specialized research studies and for solving unique problems. Our experienced staff is capable of developing a solution to meet your unique materials characterization requirements.

Applying Automation to Wear Debris Particle Characterization (ASTM-F 1877) for Spinal Implants
Assessment of the wear of total intervertebral disc (IVD) prostheses is an essential component to the FDA approval process. RJ Lee Group (RJLG) experts have utilized automated Scanning Electron Microscope (SEM) technology and provided results over large sample populations in rapid turn-around-times. This automated method has allowed our experts to spend more time providing service to our clients to ensure satisfaction and reduce costs.