Materials - New Testing Services: Hitachi S5500
RJ Lee Group is currently hosting the Hitachi S-5500, an electron microscope that combines the best features of scanning electron microscopy (SEM) and scanning transmission electron microscopy (STEM). This instrument has the capacity to gather information on samples that single standard microscopy techniques - such as TEM and SEM - are not able to accomplish when used alone.

The S-5500 is revolutionizing the face of microscopy by combining the benefits of field emission SEM and low kV STEM microscopy in a single instrument. The highlight of this tool is the cold field emission source and the in-lens technology, which together achieve the world's highest imaging resolution of 0.4 nm at 30 kV. However, the S-5500 also has a multitude of other capabilities that make this one the most unique and powerful material characterization microscopes available to scientists today.

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