Petrography is an important part of bridge construction

What Can Petrographic Analysis Tell You About the Condition of Concrete Structures?

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  • 3:59PM Dec 09, 2014
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According to a 2013 Report Card for America’s Infrastructure, 1 in 9 bridges in metropolitan areas are structurally deficient. The estimated investment needed to eliminate the backlog of deficient bridges by 2028 is $20.5 billion annually—that’s $8 billion more per year than currently invested. Recently, CBS addressed the topic of crumbling roads and bridges in […]

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Vermiculite Questions and Answers – LAB.055.1 and 198.8

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  • 10:51AM Nov 06, 2014
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Vermiculite Questions and Answers – LAB.055.1* and 198.8 Recently changes to the New York State Department of Health’s (NYS DOH) requirements for vermiculite containing materials have made staying current and up-to-date with the guidelines for compliance critical. Thousands of structures across New York State with spray-on fireproofing containing vermiculite (SOF-V) are affected by these new regulations. RJ Lee Group […]

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  • 2:49PM Sep 24, 2014
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All RJ Lee Group Blog Posts RSS Feed Subscribe to RSS headline updates from: Powered by FeedBurner Analytical Equipment Blog Posts RSS Feed Subscribe to RSS headline updates from: Powered by FeedBurner Construction Materials Blog Posts RSS Feed Subscribe to RSS headline updates from: Powered by FeedBurner Consumer Products Blog Posts RSS Feed Subscribe to […]

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glass delamination pharmaceutical vial root cause

Making the Case: Using the SEM in Glass Delamination Investigations

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  • 10:07AM Mar 10, 2014
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The life sciences industry faces persistent challenges in assuring glass compatibility with products. One of the most serious challenges is that of glass delamination. Glass delamination, which occurs in vials, is a complex result of various factors including product composition, glass composition, glass forming temperature, and surface treatment. When delamination results in lamellae (flakes) or […]

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Silicon Wafer Manufacturing Stress and Defects

Problems with Silicon Wafer Stress? Raman Can Help Identify and Prevent Processing Defects

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  • 2:40AM Feb 21, 2014
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As a silicon wafer manufacturer, you are faced with pressure to increase yield and speed up the manufacturing process—all while maintaining your product’s quality. Altering even minor processing parameters can generate stress on a wafer’s crystal lattice leading to an increased number of damaged or defective devices on a given wafer. Because most strain patterns […]

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