RJLG’s analysis of Gunshot Residue (GSR) utilizes computer controlled scanning electron microscopy (CCSEM) to analyze samples and flag potential GSR particles. Afterwards, a trained analyst relocates and confirms the flagged particles. High atomic number particles are detected on the basis of backscatter intensity. The CCSEM analysis, on a particle-by-particle basis, retains the individual feature characteristics and can relate the presence of Pb, Sb, or Ba to a single particle. When the instrument detects particles with the presence of Pb, Sb or Ba, it flags the particle as potential GSR and stores images, composition and coordinate data for relocation and confirmation by manual microscopy after the automated analysis is completed. A summary run sheet is generated with stored image and spectral data for relocation and confirmation of GSR particulate.