Materials behavior can be significantly altered by changes in the size and shape of microscopic particles.  To ensure the performance of products, an accurate representation of particle size is essential to the manufacturing process. Numerous methods have been utilized to obtain this information, though some are more robust than others. Computer controlled scanning electron microscopy is a fast and efficient way to obtain morphological and chemical information. It is not limited by the refractive index of the material being analyzed or the light scattering properties of the sample. After assessing the size of individual particles, the measurements are used to assemble the particle size distribution. CCSEM is able to measure the size of individual particles in agglomerations, whereas laser diffraction cannot. Furthermore, the use of the SEM in the analysis allows RJLG to analyze particle shape, including surface topography, which can have significant effects on flow and compaction characteristics.