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Consulting Services Laboratory Services
  • Failure & Defect Analysis
  • Foreign Material Identification
  • Litigation Support
  • Product Development Support
  • Source Contamination Assessment
  • Source Apportionment
  • Materials Characterization
  • Chemical Analysis
  • Morphology
  • Biological, Electrical and Thermal Properties
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Partnerships
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Additional Resources:
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Instrumentation & Techniques
Related Instrumentation spacer

The characterization of materials often requires the implementation of one or more instruments and techniques. In the hands of RJLG’s experienced scientists, our ever-growing array of capabilities provides us with unique and robust problem-solving tools.

Among the instrumentation used: Ultra High Resolution SEM, XPS, XRD, TEM, AFM, ICP

Click here to learn more about the instrumentation used within our Nanocharacterization services.