tlersch@rjlg.com
Job Title:
Scientist
Experience Level
Ms. Traci Lersch joined RJLG in 1988 and has over 20 years professional experience operating the transmission electron microscope (TEM) and scanning electron microscope (SEM) for material characterization. She has been involved in identifying materials through Manual scanning electron microscopy (MSEM), computer-controlled scanning electron microscopy (CCSEM) and energy dispersive techniques. Ms. Lersch's skills include, but are not limited to, preparing air, bulk, water and metal samples, and photographing, developing and printing electron micrographs.
She has published in peer-reviewed literature.
Location(s)
Pennsylvania - Headquarters (RJ LeeGroup, Inc.)
Related Services
Materials
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