Murtha, Allison C.
amurtha@rjlg.com

Job Title:
Forensic Scientist

Degrees Earned
MS, Forensic Science & Law, Duquesne University, 2007
BA, Biochemistry, Duquesne University, 2006

Experience Level
Ms. Allison Murtha has worked for 6 years as a forensic scientist at RJLG and is now qualified as an expert witness in the area of gunshot residue in Delaware, Iowa, Kansas, Maryland, Michigan, New Jersey, New York and Pennsylvania. Her areas of expertise include trace evidence (specifically GSR) and environmental/materials analysis.

In December 2006, Ms. Murtha moved on to Waynesburg University, in partnership with RJLG, where she was responsible for managing and maintaining the Company's forensic lab instrumentation on campus, as well as teaching several forensic-based courses. Her instrumentation background includes knowledge of the personal scanning electron microscope (SEM) -manual and automated analysis, polarized light microscope, comparison microscope, and UV microspectrophotometer. She also has experience with Raman spectroscopy, the FEI field emission microscope, and the JOEL SEM.

Early in her career at RJLG, as an analyst in the environmental and materials groups, Allison's work was highlighted when she logged over 1,500 hours for the characterization of World Trade Center dust by scanning electron microscopy (SEM).

Ms. Murtha has presented research at both the 2008 MAAFS (Mid-Atlantic Association of Forensics Scientists) meeting and the 2008 SCANNING meeting. At both meetings she presented, "The Fluorescence of Gunpowder: A New Approach to Distance Determination".

Ms. Murtha is a member of the Phi Sigma Lambda Professional Forensic Fraternity. She is also a member of MAAFS, the Mid-Atlantic Association of Forensic Scientists.

Location(s)
Pennsylvania - Headquarters (RJ LeeGroup, Inc.)

Related Services
Criminal Forensics