Capabilities

We provide testing services to certify product and materials compliance, support quality control, and ensure the health and safety of workers and their environment. We provide assistance for clients who are not sure what tests they need. Our accredited materials characterization laboratory is the foundation of all the services of RJ Lee Group provides, including standardized testing for compliance, industrial hygiene and environmental analyses, quality control, and materials research and development.

We provide credentialed expertise supported built by robust scientific data. We provide significant support to industrial clients for product development, industrial hygiene and overall production support.

RJ Lee Group maintains a visible and respected reputation within the legal community, having offered scientific support in civil litigation matters for nearly 30 years. 

  • Product Liability 
  • Toxic Tort
  • Construction Defect
  • Fugitive Emission
  • Personal Injury
  • Patent Infringement
  • Contract Disputes
  • Insurance Subrogation

Subject Matter Experts

From our core business of providing scientific solutions to our clients, we have developed innovative products. Some are produced internally, and some have arisen from partnerships with other research organizations. 

For example, we build lab software solutions to help manage and streamline your labs data, and environmental testing products for a variety of applications. 

  • IntelliSEM is a powerful automated particle analysis system.
  • ParticleID is  a customizable cloud hosted web application used to identify foreign particulate matter and  assist with root cause investigations. 

Other products we create count particles and help keep the air and environment safe.

RJ Lee Group is a materials analysis laboratory and consulting company which serves many different industries. We offer scientific solutions such as industrial forensics services, laboratory and testing services, litigation support, and laboratory software to many industries:

RJ Lee Group Improves Capabilities in X-ray Photoelectron Spectroscopy with Purchase of K-Alpha System

RJ Lee Group News

October 8, 2008

RJ Lee Group, a Pittsburgh-based scientific analysis, consulting, and development firm, announces the upcoming launch of Thermo Fisher Scientific’s K-Alpha X-ray photoelectron spectroscopy (XPS) system in their analytical work.  XPS is a surface spectroscopic technique that measures elemental composition within the topmost 2-10 nanometers of a material surface.  XPS can also provide important oxidation state and other chemical bonding information for many elements that is not available from other techniques.

Dr. Brian Strohmeier, senior scientist and manager of corporate TEM and optical laboratory operations, gave a clear perspective on the value of the K-Alpha when he said, “The K-Alpha XPS system represents the latest state-of-the-art in photoelectron spectroscopy in terms of total instrument performance and capability range.  The instrument was designed to increase both the sample throughput of the surface analysis laboratory and the reliability of the data produced.  This helps us solve our client’s most difficult surface-related problems in the most efficient manner.”

In general, the XPS method is a valuable source of information for many different applications, and RJLG scientists rely upon this method to secure highly pragmatic data in numerous areas, including: adhesion failures, corrosion studies, paint defects, coating characterizations, defect and failure analysis, surface and depth profiling, biocompatibility studies, surface contamination identification, surface oxidation studies, and polymer surface characterization.

RJ Lee Group applies the XPS technique to our samples for several reasons, including its ability to provide both qualitative and semi-quantitative results for most elemental analysis, the variety of samples the instrument will accept, the ease of sample preparation, and the nondestructive nature of testing compared to other electron and ion beam surface analysis techniques.  This method produces excellent results while reducing the time and costs involved with sampling procedures – allowing RJ Lee Group to pass on valuable savings to our clients.

More specifically, the K-Alpha system brings the importance of XPS up a notch with significant technical enhancements.  The compact, fully integrated, and highly automated design of the K-Alpha simplifies operation and improves all aspects of sample analysis and data processing, which results in reduced cost of analysis. The instrument utilizes a monochromatic aluminum K-Alpha X-ray source with variable microfocusing capability (30-400 μm), a high sensitivity electron energy analyzer, and a multi-channel detection system to provide maximum sensitivity for all types of analysis.  The K-Alpha is the ideal XPS instrument for all types of solid sample surface analysis such as metals, ceramics, polymers, biological materials, semiconductors, glasses, thin films, and other vacuum-compatible inorganic and organic materials.

RJ Lee Group, first established in 1980 with a core group of five individuals, now has operations in five states and employs approximately 250 people who are committed to the heart of RJ Lee Group- innovation and excellence.  Technical consulting and materials characterization forms the baseline of our work, but we also excel in education advancement, software development, technology commercialization, and resource recovery.  As a result of our diverse interests and our expertise in materials science, RJ Lee Group is well positioned to identify and pursue new business opportunities as we continue to develop unique approaches to our nation’s biggest scientific and environmental hurdles.  To find out more about our best-in class analytical and consulting services, check out the RJ Lee Group Web site at http://www.rjleegroup.com.

 

To view the XPS K-Alpha Unit handout, please click here. 

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