Capabilities

We provide testing services to certify product and materials compliance, support quality control, and ensure the health and safety of workers and their environment. We provide assistance for clients who are not sure what tests they need. Our accredited materials characterization laboratory is the foundation of all the services of RJ Lee Group provides, including standardized testing for compliance, industrial hygiene and environmental analyses, quality control, and materials research and development.

We provide credentialed expertise supported built by robust scientific data. We provide significant support to industrial clients for product development, industrial hygiene and overall production support.

RJ Lee Group maintains a visible and respected reputation within the legal community, having offered scientific support in civil litigation matters for nearly 30 years. 

  • Product Liability 
  • Toxic Tort
  • Construction Defect
  • Fugitive Emission
  • Personal Injury
  • Patent Infringement
  • Contract Disputes
  • Insurance Subrogation

Subject Matter Experts

From our core business of providing scientific solutions to our clients, we have developed innovative products. Some are produced internally, and some have arisen from partnerships with other research organizations. 

For example, we build lab software solutions to help manage and streamline your labs data, and environmental testing products for a variety of applications. 

  • IntelliSEM is a powerful automated particle analysis system.
  • ParticleID is  a customizable cloud hosted web application used to identify foreign particulate matter and  assist with root cause investigations. 

Other products we create count particles and help keep the air and environment safe.

RJ Lee Group is a materials analysis laboratory and consulting company which serves many different industries. We offer scientific solutions such as industrial forensics services, laboratory and testing services, litigation support, and laboratory software to many industries:

State-of-the-Art Instrumentation from Hitachi

RJ Lee Group News

October 1, 2009

RJ Lee Group has added several pieces of instrumentation to its collection of high-end analytical equipment, including the Hitachi HD-2300 field emission scanning transmission electron microscope (FE-STEM). The HD-2300 200kV FE-STEM is the newest high resolution, high throughput STEM/SEM designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance with the ease of use of a basic SEM. The other microscopes include the HF-2000 cold field emission transmission electron microscope (FE-TEM); TM-1000 Tabletop Microscope; and S-3400N variable pressure scanning electron microscope (VP SEM).

Here is a brief description of each instrument:

HD-2300 Scanning Transmitted Electron Microscope

Hitachi’s HD-2300 200kV FE-STEM is the newest high resolution, high throughput STEM/SEM designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance with the ease of use of a basic SEM.  With an energy dispersive X-ray spectroscopy (EDS) solid angle of 0.4sr, high sensitivity EDS spectral maps can be generated quickly.  Hitachi’s live diffraction observation allows simultaneous viewing of the image and diffraction pattern, enabling adjustment of a specific sample orientation without tedious switching between diffraction and imaging allow for rapid image observation with the correct sample orientation. The HD-2300 is an essential instrument for the advancement of Nanotechnology in the 21st Century.

HF-2000 Cold Field Emission Transmission Electron Microscope

The Hitachi HF-2000 is a high performance FE-TEM/STEM designed for routine materials characterization at high throughputs.  The cold field emitter provides high resolution imaging and analysis due to the high source brightness (109 A/cm2 sr) and small energy spread of 0.3eV. The excellent coherency of the emitter allow for the ultimate performance for holography and EELS. Nano-area diffraction or CBED is another excellent feature of the HF-2000 for the characterization of nano-particles or interfacial variations in materials. The cold field emission source also provides approximately a nano ampere of probe current in a finely focused probe of less than 1nm.  The HF-2000 has excellent analytical capabilities at the nanometer level for high end characterization of tomorrow’s nanomaterials.

TM-1000 Tabletop MicroscopeLaboratory Manager – QA Manager

Compact, lightweight, easy to use, and operates from any 120V outlet makes the TM-1000 Tabletop Microscope a versatile microscope with resolution 10 fold higher than an optical microscope.  All that is required to produce stunning, high quality images is to load the sample, push auto start, auto contrast and brightness and auto focus.  No sample preparation is necessary and with less than 10 minutes of training you can begin to take images like a pro.  Unlike most other Tabletop Microscopes, the TM-1000 can be equipped with an optional EDS system.

S-3400N Variable Pressure Scanning Electron MicroscopeLaboratory Manager – QA Manager

The S-3400N VP SEM continues to be the market leader for large chamber, tungsten based variable pressure SEMs.  Several patents such as Quad Bias, SE Bias Electron Accelerator Plate, high speed five quadrant Backscattered Electron Detector, 3D Viewer function for surface roughness and 3D rendering, plus a wealth of other features provide the best performance and ease of use over any other manufacturer.  The analytical chamber design of the S-3400N allows simultaneous analysis of several detector types such as EDS, wavelength-dispersive spectrometer (WDS), and electron backscattered diffraction (EBSD).  Samples as tall as 100mm and as wide as 250mm can be observed with the computer controlled, eucentric motorized stage.

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