RJ Lee Group Brings Semantics to Forensic Evidence Management with OWLIM

RJ Lee Group Brings Semantics to Forensic Evidence Management with OWLIM

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  • 11:15AM Jul 12, 2012
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(MONROEVILLE, Pa., July 12, 2012) Pictures from the crime scene, tests on the murder weapon, the toxicology report; all the information a CSI investigator might need can now be retrieved and organized more easily with semantic technology.

RJ Lee Group, a developer of information management systems for law enforcement, has chosen to integrate the OWLIMTM triple store from Ontotext into its information management system for forensic evidence.  The THEMIS system makes evidence information management easier, in part by allowing crime labs and police departments to customize searching, labeling and categorization using flexible semantic technologies.

Ontotext and RJ Lee Group have signed a long-term OEM agreement to bring the power of the world’s leading triple store into the THEMIS system.  OWLIM stores and extends metadata generated by THEMIS in order to make finding related pieces of data easier.  The metadata is organized with ontologies, a data schema that can be customized without requiring expensive re-working of the underlying data.

“Evidence management systems must be rigorous and can be quite complex.  One of the things our customers like about THEMIS is its ease of use while managing complex data efficiently.  We are confident that OWLIM provides our users with added value by making customization and search even better and easier.  We have already tested it in the field and the results are very positive,” said Dennis Moore, THEMIS product manager at RJ Lee Group.

“Of course we’re very pleased to be partnering with RJ Lee Group, a company with a solid reputation and commitment to its customers,” said Matthew Petrillo, president of Ontotext USA.  “We share that commitment at Ontotext and we look forward to working together to put the value of semantic technologies into practice for the important work of law enforcement.”

For more information contact: Ontotext USA: Matthew Petrillo, President at info@ontotext.com or 866-972-6686.