Capabilities

We provide testing services to certify product and materials compliance, support quality control, and ensure the health and safety of workers and their environment. We provide assistance for clients who are not sure what tests they need. Our accredited materials characterization laboratory is the foundation of all the services of RJ Lee Group provides, including standardized testing for compliance, industrial hygiene and environmental analyses, quality control, and materials research and development.

We provide credentialed expertise supported built by robust scientific data. We provide significant support to industrial clients for product development, industrial hygiene and overall production support.

RJ Lee Group maintains a visible and respected reputation within the legal community, having offered scientific support in civil litigation matters for nearly 30 years. 

  • Product Liability 
  • Toxic Tort
  • Construction Defect
  • Fugitive Emission
  • Personal Injury
  • Patent Infringement
  • Contract Disputes
  • Insurance Subrogation

Subject Matter Experts

From our core business of providing scientific solutions to our clients, we have developed innovative products. Some are produced internally, and some have arisen from partnerships with other research organizations. 

For example, we build lab software solutions to help manage and streamline your labs data, and environmental testing products for a variety of applications. 

  • IntelliSEM is a powerful automated particle analysis system.
  • ParticleID is  a customizable cloud hosted web application used to identify foreign particulate matter and  assist with root cause investigations. 

Other products we create count particles and help keep the air and environment safe.

RJ Lee Group is a materials analysis laboratory and consulting company which serves many different industries. We offer scientific solutions such as industrial forensics services, laboratory and testing services, litigation support, and laboratory software to many industries:

New Technique Used for 3D Microstructural Information and Next Generation Materials

RJ Lee Group News

August 26, 2013

Results show great promise for the additive manufacturing and materials modeling community.

Dr. Chris Hefferan, RJ Lee Group Materials Scientist, will be presenting at Materials Science & Technology (MS&T) 2013 in late October on an up-and-coming characterization technique that has led to a notable scientific result in fundamental research. Dr. Hefferan is one of a very few scientists involved in the building of this method and who have this expertise.

“Annealing Evolution of the Coherent Twin Distribution in Bulk High Purity Nickel,” focuses on an emerging synchrotron-based materials characterization technique (high-energy X-ray diffraction microscopy) that permits high resolution, non-destructive 3D measurement of polycrystalline microstructures. Using this technique, it is possible to determine information such as shapes of grains, crystallographic orientation of grains, and the strain state of grains. Results using this method are relevant to the structural materials community where grain boundaries are important, as well as in grain boundary engineering where materials are processed to have an abundance of a specific type of grain boundary to aid mechanical and electrical properties of a material. This technique, which is Dr. Hefferan’s expertise, shows great promise for the additive manufacturing and materials modeling community, where 3D microstructural information can lead to the next generation of materials.

Shown are reconstructions of the same high purity nickel microstructure as collected with state-of-the-art high energy X-ray diffraction microscopy and reconstructed with the forward modeling method. The same microstructure was subjected to repeated heat treatments and remapped to illustrate the dynamical response of a grain ensemble subjected to thermal stimulation. A single grain, which is embedded in this microstructure, has been extracted to demonstrate sensitivity to changes in grain boundary morphology, in response to the annealing sequence.

Shown are reconstructions of the same high purity nickel microstructure as collected with state-of-the-art high energy X-ray diffraction microscopy and reconstructed with the forward modeling method. The same microstructure was subjected to repeated heat treatments and remapped to illustrate the dynamical response of a grain ensemble subjected to thermal stimulation. A single grain, which is embedded in this microstructure, has been extracted to demonstrate sensitivity to changes in grain boundary morphology, in response to the annealing sequence.

Dr. Hefferan’s presentation will be given on Tuesday, October 29, at 10:20 am during the “Deformation and Transitions at Grain Boundaries III” Symposium at Materials Science & Technology 2013. We invite you to attend this presentation and learn more about this technique that few have mastered and how its application will influence the way we think about next generation materials.

Related Posts