We provide testing services to certify product and materials compliance, support quality control, and ensure the health and safety of workers and their environment. We provide assistance for clients who are not sure what tests they need. Our accredited materials characterization laboratory is the foundation of all the services of RJ Lee Group provides, including standardized testing for compliance, industrial hygiene and environmental analyses, quality control, and materials research and development.

We provide credentialed expertise supported built by robust scientific data. We provide significant support to industrial clients for product development, industrial hygiene and overall production support.

RJ Lee Group maintains a visible and respected reputation within the legal community, having offered scientific support in civil litigation matters for nearly 30 years. 

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From our core business of providing scientific solutions to our clients, we have developed innovative products. Some are produced internally, and some have arisen from partnerships with other research organizations. 

For example, we build lab software solutions to help manage and streamline your labs data, and environmental testing products for a variety of applications. 

  • IntelliSEM is a powerful automated particle analysis system.
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Other products we create count particles and help keep the air and environment safe.

RJ Lee Group is a materials analysis laboratory and consulting company which serves many different industries. We offer scientific solutions such as industrial forensics services, laboratory and testing services, litigation support, and laboratory software to many industries:

Exploring the Merit of Non-Destructive nf-HEDM in Characterizing Textured Materials

RJ Lee Group News

September 26, 2014

In his presentation at the 8th International Symposium on Superalloy 718 and Derivatives on Wednesday, October 1, 2014 at the 10:00 AM in the Marquis Ballroom of the Marriott City Center in Pittsburgh, PA, Dr. Chris Hefferan will describe an OIM technology, near-field High Energy X-ray Diffraction Microscopy (nf-HEDM), that enables a new way of interpreting microstructural data in textured materials.

The Population of Twin-Related Boundaries in High Purity Nickel as Measured with Near-Field High Energy X-ray Diffraction Microscopy

Understanding of both how materials are assembled and what governs their behavior while they are in service has always been a fundamental mission for materials scientists. Thus, the body of analytical instrumentation available for materials characterization is constantly growing. Included in these innovative characterization technologies is orientation imaging microscopy (OIM)—a tool that enables a new way of interpreting microstructural data in textured materials. Using the non-destructive, synchrotron-based OIM technique known as near-field high energy x-ray diffraction microscopy (nf-HEDM), we mapped a volume of nickel microstructure after it had been subjected to multiple anneals. The material response is quantified, with focused attention on the properties of the grain boundary network. Specifically, we interpreted the populations of boundaries that can be described with a Σ3n misorientation. The results exhibit sensitivity to a unique physical signal that had not been observed in previous OIM measurements and demonstrate the merit of non-destructive nf-HEDM in characterizing textured materials.

8th International Symposium on Superalloy 718 and Derivatives

The conference, sponsored by the TMS High Temperature Alloy Committee of the Structural Materials Division and by ASM International, will be held September 28-October 1, 2014, Marriott City Center, Pittsburgh, PA. It covers all aspects of metallurgical processing, materials behavior and microstructural performance for a distinct class of 718 type superalloys and derivatives. The technical presentations will focus on alloy and process development, production, product applications, trends and the development of advanced modeling tools.

We hope to see you at the conference!

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