Christopher M. Hefferan, Ph.D. | RJ Lee Group, Inc. (RJLG)

$The Characterization Advantage of Electron Backscatter Diffraction (EBSD) Microscopy$

The Characterization Advantage of Electron Backscatter Diffraction (EBSD) Microscopy

by Christopher M. Hefferan, Ph.D. | Oct 8, 2020 | Materials Insights

Written By: Christopher M. Hefferan, Ph.D Electron backscatter diffraction (EBSD) microscopy is a characterization technique used with scanning electron microscopes (SEMs) for determination of crystallographic information present in both metal and mineral samples....

The Characterization Advantage of Electron Backscatter Diffraction (EBSD) Microscopy

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