Christopher M. Hefferan, Ph.D. – RJ Lee Group, Inc. (RJLG)

Articles by Christopher M. Hefferan, Ph.D.:

The Characterization Advantage of Electron Backscatter Diffraction (EBSD) Microscopy

Materials Insights

Grain Boundary Corrosion of Alloy C-276 using Orientation Imaging via Electron Backscatter Diffraction Microscopy (EBSD)

Analytical Equipment

Metals & Alloys

The Population of Twin Related Boundaries in High Purity Nickel as measured with near-field High Energy X-ray Diffraction Microscopy

Analytical Equipment

Demonstration of Near Field High Energy X-Ray Diffraction Microscopy on High-Z Ceramic Nuclear Fuel Material

Three-dimensional Plastic Response in Polycrystalline Copper Via Near-Field High Energy X-Ray Diffraction Microscopy

Analytical Equipment

Microstructure Geometry and Topology Tracking Using High Energy X-Ray Diffraction Microscopy

Mining & Minerals

Experimental Microstructure Based Elasto-Viscoplastic Simulation to Predict Localization of Plastic Deformation in Cu

In-Situ Tensile Deformation of Zr Using Near-Field HEDM

Near-field High Energy X-ray Diffraction Microscopy in Deformed Materials

Analytical Equipment

Recovery and Recrystallization in High Purity Aluminum Using Near-field High Energy X-ray Diffraction Microscopy

Analytical Equipment

Interfaces, Dynamics and Grain Boundary Character

Measurement of Annealing Phenomena in High Purity Metals with Near-field High Energy X-ray Diffraction Microscopy

High Energy X-ray Diffraction Microscopy Microstructure Mapping

Tracking Geometrical Features using Near-field High Energy X-ray Diffraction Microscopy

Stereology and 3D Grain Boundary Network Analysis

Experimental Tests of Stereological Estimates of Grain Boundary Populations

In Situ Observation of Recovery and Grain Growth in High Purity Aluminum

Grain Growth of High Purity Nickel with High Energy X-Ray Diffraction Microscopy

Annealing Study of Grain Boundary Engineered Copper Using High Energy X-Ray Diffraction Microscopy

Plastic Response in Copper and Zirconium Observed by High Energy X-Ray Diffraction Microscopy Orientation Mapping at APS 1-ID

Quantifying Damage Accumulation Using State-of-The-Art FFT Method