Manufacturers are creating materials that have new characteristics and are using production technologies that incorporate new processes. These new variables affect the quality of the finished product. With more complex products comes the possibility of contaminants that, when discovered, warrant not only an investigation, but an integrated analytical program that extends beyond examining just the material of concern. Such a program requires more sophisticated investigative tools as well as the expertise to identify FPM and locate its source wherever it may be throughout the product’s life cycle

How RJ Lee Group Is Meeting the Challenge

Our laboratory’s instrumentation provides the analytical flexibility and precision needed to investigate and identify foreign particulate matter and defects. Our scientists provide the operational skill and analytical expertise required. We can assist with a range of investigative techniques including:

• Contamination identification
• Source determination and root cause analysis
• Particle sizing and counting
• Data basing of process materials for a proactive FPM program
• Raw materials testing and product sampling
• ID ofglass delamination and other failures
• Metallurgy and manufacturing-associated defects
• Investigative chemistry
• Nondestructive testing and evaluation for microelectronics
• Nanocharacterization including coatings and pharmaceuticals

Automated Particle Analysis

In any given sample, at any step of the process, contaminants of varying chemistry and morphology  may impact product quality. Computer-controlled scanning electron microscopy (CCSEM) allows for unattended measurement runs when analyzing large sample quantities or large areas such as in steel production. CCSEM quickly provides size, shape and chemistry/composition, and reports the results in a clear, easy-to-understand manner.