AISTech 2019

AISTech 2019

Pittsburgh, PA
6th May 2019

Join RJ Lee Group’s Richard Lee Ph.D., Gary Casuccio and Chris Hefferan Ph.D., at the AISTech: The Iron & Steel Technology Conference and Exposition on May 6-9 at the David L. Lawrence Convention Center in Pittsburgh, PA. On May 8th at 8:00 AM stop by for our technical presentation, “Detection, Measurement and Characterization of Inclusions Using Automated SEM Techniques, Part 3: Characterization and Reporting of Multi-Phase Inclusions.”

A brief description of the presentation: Automated scanning electron microscopy (SEM) analysis of inclusions is playing an increasing role in the evolution of advanced steel grades. An area where automated inclusion analysis is lacking is with respect to the accurate characterization of duplex or multi-phase inclusions. Presently, analysis of multi-phase inclusions involves the collection of x-rays from a single or multiple points on an inclusion. These results lack specificity needed to provide an “accurate” identification of the type of inclusion and thus can be misleading. Recent improvements in automated SEM analysis enable intelligent decisions to be made regarding the detection, analysis and reporting of multi-phase inclusions.

Dr. Lee will also be participating in the panel discussion, “Kent D. Peaslee Memorial Session,” on May 8th from 9:30 – 10:00am in Room 411, addressing steelmaking & casting.

Stop by our exhibit at booth #3420 to learn more about RJ Lee Group’s metals & alloys and engineering services, including the ASCAT. TESCAN, the manufacturer of the SEM system RJ Lee Group’s Intellisem ASCAT system is built upon, will also be exhibiting in booth #1923.

This conference is an excellent opportunity for anyone in the steel industry to learn more and network with relevant professionals, with over 550 technical presentations and 8,000 attendees. To learn more about this event, please click here. To schedule a meeting with one of our experts at this event, please click the button below.

We look forward to seeing you there!

Meet with us at this event!