RJ Lee Group and
We build lab software solutions that work across the material and chemical industry.
Our Software Tools
Easy To Use
Better Use of Data
A Powerful Automated Particle Analysis System
The IntelliSEM characterizes large populations of particles accurately, automatically, and fast. Our software suite applies high-performance instrument-control and data analysis algorithms to state-of-the-science scanning electron microscope (SEM) and energy dispersive X-ray spectroscopy (EDS) systems. It also provides a rich set of tools for data visualization, mining, and management. This ultra-fast particle analysis system rapidly generates statistical profiles of large particle populations.
SEAMS for Big Data
Collecting and Connecting Your Data
SEAMS is a Big Data platform that provides a complete toolset for the collection, indexing, searching, analysis, linking and syndication of multimedia engineering and scientific data. It is an enterprise informational map that syndicates data across technology borders so it can be used more efficiently, more intuitively and more effectively for decision making.
Particulate Identification for FPM and Root Cause Investigations
This software enables the user to compile, store, search and mine analytical data to optimize processes for foreign particulate and materials investigations. The ability to create internal known laboratory reference collections adds significant value to an investigation. ParticleID allows for analysis, comparison, and reporting.
RJ Lee Group’s Laboratory Software Solutions
RJ Lee Group is an industrial forensics analytical laboratory and scientific consulting firm. We partner with our clients to deal with problems encountered during the manufacturing process, to ensure regulatory compliance, and to uncover and understand the root cause of product failure. Our network of technical experts provides you with customized solutions that are flexible, scalable, and best-suited to your application. In building our own laboratory over the past 35 years, we have built unique software solutions for issues that labs are likely to encounter. We can offer these software products or offer our software services to many industries, feel free to reach out to us to see if one can fit your labs unique needs.
RJ Lee Group Lab Products
Did You Know?
RJ Lee Group is on the International Space Station
RJ Lee Group built a TPS100 unit to collect nanoscale particles on the International Space Station. The TPS100 is a compact, microcontroller-based sampling device that uses thermophoresis to deposit nanoparticles directly on an electron microscope (EM) grid. Thermophoresis is particle movement induced by a thermal gradient. The TPS100 uses a temperature gradient across a narrow sampling channel to capture airborne particles on the grid. The technology is especially effective for capturing nanoparticles – a thousand such particles laid side-by-side would roughly equal the width of a human hair. By virtue of the sampling process, nanoparticles collected by the TPS100 are highly visible compared to other sampling approaches such as filter based methods in which the nanoparticles can be masked by larger particles or by the sampling media itself. The TPS100 attracted the attention of NASA, who will now be using the sampler in slightly modified form – dubbed Active Aerosol Sampler (AAS) – to help quantify airborne particles in the ISS
The National Institute for Occupational Safety and Health (NIOSH) uses RJ Lee Group’s TPS100
See RJ Lee Group’s work with NIOSH, in this 2020 article by Royal Society of Chemistry entitled Characterization of aerosolized particles from nanoclay-enabled composites during manipulation processes. Manufacturing, processing, use, and disposal of nanoclay-enabled composites potentially lead to the release of nanoclay particles from the polymer matrix in which they are embedded; however, exposures to airborne particles are poorly understood. The present study was conducted to characterize airborne particles released during sanding of nanoclay-enabled thermoplastic composites.
The Characterization Advantage of Electron Backscatter Diffraction (EBSD) Microscopy
Electron backscatter diffraction (EBSD) microscopy is a characterization technique used with scanning electron microscopes (SEMs) for determination of crystallographic information present in both metal and mineral samples. Much like energy dispersive X-ray spectroscopy (EDS), which provides the elemental composition through the interaction of electron beam and individual atoms, EBSD uses the interaction of the electron beam with a localized, periodic arrangement of atoms to generate diffraction (Kikuchi) patterns that can be captured with an unique camera-beam-detector geometry