Exploring the Merit of Non-Destructive nf-HEDM in Characterizing Textured Materials

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  • 1:57PM Sep 26, 2014
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In his presentation at the 8th International Symposium on Superalloy 718 and Derivatives on Wednesday, October 1, 2014 at the 10:00 AM in the Marquis Ballroom of the Marriott City Center in Pittsburgh, PA, Dr. Chris Hefferan will describe an OIM technology, near-field High Energy X-ray Diffraction Microscopy (nf-HEDM), that enables a new way of […]

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